Whole Pattern Fitting for Two-Dimensional Diffraction Patterns from Polycrystalline Materials
نویسندگان
چکیده
منابع مشابه
Characterization of two-dimensional colloidal polycrystalline materials using optical diffraction
We present an optical-diffraction method for quantitative characterization of two-dimensional colloidal polycrystalline materials. From the angular-diffraction profile we can estimate both the average size of the crystalline grain and the defect density within the grains. Our statistical diffraction model shows that the diffraction line shape is close to a Lorentzian profile if a lot of defects...
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We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ~10(3)-10(4) s(-1) in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This appr...
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ژورنال
عنوان ژورنال: The Review of High Pressure Science and Technology
سال: 2012
ISSN: 0917-639X,1348-1940
DOI: 10.4131/jshpreview.22.144